Inspection & Test

Displaying 1 - 10 of 300

X-ray inspection systems fit the bill for automotive supplier

X-ray inspection systems fit the bill for automotive supplier
The Italian automotive supplier Magneti Marelli has chosen two X-ray inspection systems from GOEPEL electronic for its quality assurance of electronic assemblies. At production sites in France and Slovakia, the X Line · 3D systems are used to inspect high-complexity PCBs. Electronic assemblies for automobiles are subject to particularly high quality requirements by the manufacturers.
14th August 2017

Cantilever design contactor delivers enhanced MCU testing

Cantilever design contactor delivers enhanced MCU testing
The recently launched MiCon contactor from Multitest leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPsand Application Specific ICs. Evaluations at customer test floors showed substantial improvements in first pass yield, life span and cleaning cycles compared to spring pin solutions.
8th August 2017

Thermal imaging camera accelerates board inspection

Thermal imaging camera accelerates board inspection
An application note details how FLIR Systems’ ETS320 thermal imaging camera is being used by Stuttgart-based ISOMEDIA to investigate and speed-up the repair of assembled printed circuit boards (PBA). ISOMEDIA is a leading customer service provider and same day repair centre for leading brands of mobile devices in Germany.
7th August 2017


Upgrades enhance solid state drive test coverage

Solid State Drive (SSD) test coverage has been extended by Advantest with enhancements to the company’s MPT3000 series. With hundreds of systems already installed, the product line is now extended to cover more test insertions including engineering, low-volume production, and built-in self-test (BIST) applications, all with the same MPT3000 architecture and software.
1st August 2017

Contactor demonstrates electrical and mechanical performance

Contactor demonstrates electrical and mechanical performance
Multitest’s new 0.3mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP (Wafer Level Chip Scale Packaging) production ramp.
31st July 2017

Focused ion beam scanning electron microscope

Focused ion beam scanning electron microscope
The ZEISS Crossbeam 550 is said to feature a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation. Nanostructures such as composites, metals, biomaterials or semiconductors can be investigated with analytical and imaging methods in parallel.
29th July 2017

Fixture extends test capabilities for display driver ICs

Semiconductor test equipment supplier Advantest has introduced the RND440 Type 3 fixture, an optional enhancement on its T6391 display driver IC (DDI) tester that makes the system capable of massively parallel testing of chip-on-film (CoF) packages for the latest generation of smart phone screens.
24th July 2017

Soak booster option cuts cost of test

Soak booster option cuts cost of test
An enhanced Soak Booster option has been added to Multitest’s MT9928 tri-temp handler. It cuts down the soak time by up to 50%. With this development Multitest is responding to the market need for temperature testing of large devices where soak time closely correlates with throughput, and as a result, impacts the cost of test.
13th July 2017

AI chip to speed predictive maintenance in smart factories

AI chip to speed predictive maintenance in smart factories
ROHM Semiconductor and A*STAR’s Institute of Microelectronics (IME), a renowned research institute under the Agency for Science, Technology and Research (A*STAR), recently announced the joint development of an artificial intelligence (AI) chip to boost efficiency in predictive maintenance for smart factories.
23rd June 2017

Mixed-signal channel card aids IoT device testing

A high-resolution, highly accurate mixed-signal channel card has been added to its Wave Scale MX product family by Advantest. It extends the series range in testing analogue-to-digital and digital-to-analogue waveform converters. The Wave Scale MX high-resolution card combines high parallel testing capability with reliable AC and DC performance.
22nd June 2017


Inspection & Test documents


Sign up to view our publications

Sign up

Sign up to view our downloads

Sign up

Motek 2017
9th October 2017
Germany Stuttgart