Test & Measurement

Isolated monitor arm and console enhances X-ray inspection platform

14th November 2016
Mick Elliott
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The Mk 4 XT V platform iteration which introduces key improvements to enhance user experience and system reliability changes to increase up time has been introduced by Nikon Metrology. XT V is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis to the highest level of detail.

The Mk 4 now offers advancements which not only include changes visually, but also incorporate a number of practical modifications to increase the system’s performance. Perhaps the biggest change is that it is now officially a Nikon branded product, which helps to instill confidence and heritage within the system range.

XT V real-time X-ray allows users to intuitively navigate complex printed circuit boards and electronic components to quickly trace defects even on the most challenging electronic components and assemblies.

The high-precision system facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications.

The system offers a number of highlights, including feature recognition, making it ideal for any electronics development and production environment.

An isolated monitor arm and console has been added to the face-lift XT V, which allows for independent adjustment helping to maximise user comfort and allows for any operator to use with ease.

Mk 4 also features an improved profile with the PC integrated within the machine chassis therefore taking up less space on the shop floor.

There is also improved safety and reliability with compliance to the latest European standards thanks to internal changes including updates in the service access area, with coolant pumps now isolated from the electronics.

This has helped to improve the way the system is serviced allowing routine maintenance and repairs to be done quickly and efficiently.

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