Semiconductor test equipment supplier Advantest has joined the Global Compact (UNGC), a global initiative of the United Nations, and the Global Compact Network Japan, a local network based in Japan. The UNGC is a special initiative of the UN Secretary-General which encourages companies and organisations to exert responsible and creative social leadership and to participate in creating a global framework for sustainable growth.
A software bridge, dubbed SmartShell has been introduced by Advantest to enable direct communication between any of its V93000 single scalable platform testers and electronic design automation (EDA) environments such as Tessent Silicon Insight software from Mentor.
The GPWGD high-resolution module from Advantest features what is claimed to be the industry’s highest analogue-performance digitiser. It supports testing of high-resolution audio digital-to-analogue converters (DACs) embedded in power-management ICs (PMICs) as well as stand-alone high-resolution audio devices.
Products and services enabling the development of 5G technology will be featured by Advantest at SEMICON Southeast Asia in Kuala Lumpur (May 7-9). Live product demonstrations and digital graphics will showcase its IC test solutions.
Advantest Europe has been recognised for the second time as one of “Germany’s Best Employers” by consulting firm, Great Place to Work. The annual competition ranks German companies of all sectors and sizes based on the attractiveness of their corporate culture in order to determine the 100 best employers nationally.
The technical program and complete list of keynote speakers for both locations of Advantest’s VOICE 2019 Developer Conference have been finalised. For the first time, the conference will be held in Scottsdale, Arizona (May 14-15) and Singapore (May 23) under the unifying theme "Measure the Connected World and Everything in It.”
Semiconductor test equipment supplier Advantest will showcase its CloudTesting Services (CTS) at DATE 2019 in Florence (March 26-28). The annual conference combines a world-class technical program with an international exhibition of electronic design automation and test technologies.
Semiconductor test equipment supplier Advantest will demonstrate and present a technical paper on its V93000 artificial intelligence (AI) test solution for the diverse and fast-growing AI and high-performance computing markets during SEMICON China in Shanghai (March 20-22) The V93000 Single Scalable Platform is already in widespread use at major AI chip designers around the world including China’s leading AI fabless companies.
Semiconductor test equipment supplier Advantest has expanded overseas support for its AirLogger WM2000 series of wireless data loggers. Following the expansion of support to China and Vietnam, as announced in January 2019, the company also started support in the United States, EU and Thailand from February.
Semiconductor test equipment supplier Advantest has closed its acquisition of the commercial Semiconductor System Level Test business (“Test Systems”), from Astronics on renegotiated terms due to a change in business conditions related to the semiconductor industry and Test Systems business.
Semicon Korea (January 23-25) in Seoul will provide the platform for Advantest to feature its wide range of solutions for advanced IC testing and wafer metrology. Among the products that Advantest will feature are systems and enhancements that the company has recently announced.
Registration has opened for Advantest's VOICE 2019 Developer Conference, along with the announcement of the full keynote speaker line up for the US program. The conference will be held in two new locations – Scottsdale, Arizona on May 14-15 and Singapore on May 23 – under the unifying theme “Measure the Connected World and Everything in It”.
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems led by Tetsuo Endoh has successfully demonstrated operation of a high-writing-speed spin-transfer torque magnetic random access memory (STT-MRAM) using an Advantest memory test system.
A tool that measures fine pattern dimensions on photomasks with higher precision and stability has been launched by Advantest. The E 3650 MASK MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) uses the company’s proprietary technology.
The T5851 STM16G memory tester from Advantest is for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
A module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications has been introduced by Advantest. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdown voltages.
Measurement tools and solutions for automotive, communications and consumer devices will be showcased by Advantest at electronica in Munich, Germany (13-16 November). Visitors will be able to attend demonstrations of the on-demand CloudTesting Service, and see the latest capabilities of its EVA100 analogue/mixed-signal IC Test solution and theV93000 A-Class SoC test system for device engineering and production, as well as its HA7300 stimulus test cell for differential pressure sensors.
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems (pictured), led by Tetsuo Endoh has successfully developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM) in units of microamperes and nanoseconds, using an Advantest memory test system.
Test Systems Strategies (TSSI), and Advantest CloudTesting Service (CTS), have announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform.
Leading semiconductor test equipment supplier Advantest has released its V93000 SMU8 parametric tester to meet chip makers’ process-characterisation and monitoring needs for the exacting measurements required on the 28nm to 3nm process nodes and beyond.