Advantest Europe GmbH

Address:
Stefan-George-Ring 2



81929 München
Germany

Phone: +49-89-99312-131

Fax: +49-89-99312-108

Web: https://www.advantest.com/


Advantest Europe GmbH articles

Displaying 1 - 20 of 67

Advantest wins best employer award

Advantest wins best employer award
Advantest Europe has been recognised for the second time as one of “Germany’s Best Employers” by consulting firm, Great Place to Work. The annual competition ranks German companies of all sectors and sizes based on the attractiveness of their corporate culture in order to determine the 100 best employers nationally.
5th April 2019

Keynote speakers announced for VOICE 2019

The technical program and complete list of keynote speakers for both locations of Advantest’s VOICE 2019 Developer Conference have been finalised. For the first time, the conference will be held in Scottsdale, Arizona (May 14-15) and Singapore (May 23) under the unifying theme "Measure the Connected World and Everything in It.”
3rd April 2019

Silicon test solution set for DATE in Florence

Semiconductor test equipment supplier Advantest will showcase its CloudTesting Services (CTS) at DATE 2019 in Florence (March 26-28). The annual conference combines a world-class technical program with an international exhibition of electronic design automation and test technologies.
21st March 2019


SEMICON China to feature AI test solution

Semiconductor test equipment supplier Advantest will demonstrate and present a technical paper on its V93000 artificial intelligence (AI) test solution for the diverse and fast-growing AI and high-performance computing markets during SEMICON China in Shanghai (March 20-22) The V93000 Single Scalable Platform is already in widespread use at major AI chip designers around the world including China’s leading AI fabless companies.
11th March 2019

US, EU support announced for wireless data logger

US, EU support announced for wireless data logger
Semiconductor test equipment supplier Advantest has expanded overseas support for its AirLogger WM2000 series of wireless data loggers. Following the expansion of support to China and Vietnam, as announced in January 2019, the company also started support in the United States, EU and Thailand from February.
18th February 2019

Advantest closes acquisition on renegotiated terms

Semiconductor test equipment supplier Advantest has closed its acquisition of the commercial Semiconductor System Level Test business (“Test Systems”), from Astronics on renegotiated terms due to a change in business conditions related to the semiconductor industry and Test Systems business.
14th February 2019

IC testing technology centre stage at Semicon Korea

Semicon Korea (January 23-25) in Seoul will provide the platform for Advantest to feature its wide range of solutions for advanced IC testing and wafer metrology. Among the products that Advantest will feature are systems and enhancements that the company has recently announced.
15th January 2019

Keynote speakers unveiled for VOICE 2019

Registration has opened for Advantest's VOICE 2019 Developer Conference, along with the announcement of the full keynote speaker line up for the US program. The conference will be held in two new locations – Scottsdale, Arizona on May 14-15 and Singapore on May 23 – under the unifying theme “Measure the Connected World and Everything in It”.
2nd January 2019

Experiment confirms high-speed potential of STT-MRAM

Experiment confirms high-speed potential of STT-MRAM
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems led by Tetsuo Endoh has successfully demonstrated operation of a high-writing-speed spin-transfer torque magnetic random access memory (STT-MRAM) using an Advantest memory test system.
5th December 2018

Photomask measurement tool increases throughput

Photomask measurement tool increases throughput
A tool that measures fine pattern dimensions on photomasks with higher precision and stability has been launched by Advantest. The E 3650 MASK MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) uses the company’s proprietary technology.
29th November 2018

Memory tester meets 5G chip needs

The T5851 STM16G memory tester from Advantest is for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
27th November 2018

Module extends tester's range to high-voltage semiconductors

Module extends tester's range to high-voltage semiconductors
A module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications has been introduced by Advantest. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdown voltages.
13th November 2018

Cloud-based test service on parade at electronica

Measurement tools and solutions for automotive, communications and consumer devices will be showcased by Advantest at electronica in Munich, Germany (13-16 November). Visitors will be able to attend demonstrations of the on-demand CloudTesting Service, and see the latest capabilities of its EVA100 analogue/mixed-signal IC Test solution and theV93000 A-Class SoC test system for device engineering and production, as well as its HA7300 stimulus test cell for differential pressure sensors.
7th November 2018

Duo develop STT-MRAM testing module

Duo develop STT-MRAM testing module
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems (pictured), led by Tetsuo Endoh has successfully developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM) in units of microamperes and nanoseconds, using an Advantest memory test system.
31st October 2018

Duo ally on semiconductor test software initiative

Duo ally on semiconductor test software initiative
Test Systems Strategies (TSSI), and Advantest CloudTesting Service (CTS), have announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform.
30th October 2018

Parametric tester meets 28nm to 3nm process node needs

Leading semiconductor test equipment supplier Advantest has released its V93000 SMU8 parametric tester to meet chip makers’ process-characterisation and monitoring needs for the exacting measurements required on the 28nm to 3nm process nodes and beyond.
30th October 2018

Parallel testing for NAND flash memories gets a boost

Parallel testing for NAND flash memories gets a boost
Two additional members of its next-generation B6700 family of burn-in memory testers have been announced by Advantest. The B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demandfor server and mobile data-storage applications.
24th October 2018

Comprehensive test solutions on parade at ITC 2018

Hardware, software and online test solutions will be showcased by Advantest at the 2018 International Test Conference (ITC) in Phoenix (October 28-November 2). Demonstrations of its on-demand CloudTesting Service, the latest capabilities of its EVA100 analogue/mixed-signal IC test solution, a novel facial-recognition tool that combines cloud and real-time edge-computing artificial intelligence (AI) and a new tool for power profiling devices under test (DuT) at run time will be featured.
22nd October 2018

Market demand prompts next-generation memory tester

Market demand prompts next-generation memory tester
A next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle has been unveiled by Advantest. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.
10th October 2018

VOICE 2019 opens Call for Papers

Advantest has opened the call for papers for the international VOICE 2019 Developer Conference, focusing on innovative test solutions and best practices using the V93000 and T2000 system-on-chip (SoC) test platforms as well as Advantest memory testers and handler solutions.
9th October 2018


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