Semiconductor test equipment supplier, Advantest Corporation, has issued an international call for papers for its VOICE 2022 Developer Conference focusing on edge technologies and advanced test trends.

Semiconductor test equipment supplier Advantest has announced a high frequency resolution option for its TAS7400TS terahertz optical sampling analysis system.

Advantest and PDF Solutions have launched their first jointly developed offering since forming a partnership in July 2020.

Advantest is supporting SEMICON Southeast Asia (SEMICON SEA) on August 23-27 as a silver sponsor and will participate in the event’s virtual exhibition.

Advantest is pilot testing a next-generation solution for performing both high-speed scan testing and software-driven functional device testing on its V93000 platform by leveraging the existing high-speed serial I/O interfaces on advanced integrated circuits (ICs).

Semiconductor test equipment supplier Advantest will host the Virtual VOICE 2021 Developer Conference on June 21-23 to highlight the newest solutions and best practices for testing semiconductor devices.

A second half surge in the semiconductor market driven by demands for equipment to work from home and competition amongst 5G smartphone makers propelled test equipment supplier Advantest to record orders, sales and income in its 2020 financial year.

Semiconductor test equipment supplier Advantest has topped the ratings chart of the 2021 VLSI Research Customer Satisfaction Survey for the second successive year.

Semiconductor test equipment supplier Advantest will feature its newest products and solutions for advanced ICs at SEMICON China (March 17-19) at the Shanghai New International Expo Centre (SNIEC).

Advantest says it’s VOICE 2021 Developer Conference will be held as a virtual event, citing continuing health and safety concerns over the COVID-19 pandemic.

Semiconductor test equipment supplier Advantest says that its DC Scale XPS256 Device Power Supply (DPS) card, developed for use with the V93000 EXA Scale SoC test system, is now ramping to production-volume test at leading makers of communications processors.

More than a dozen of Advantest’s latest test solutions and products will be on show at the first-ever virtual SEMICON Japan (December 14-17) where once again the company will be a gold-level sponsor.

Working with its partner PDF Solutions, Advantest has introduced two new innovative cloud-based software solutions: the Advantest V93000 Dynamic Parametric Test (DPT) system powered by PDF Exensio DPT, and an edge high performance compute (HPC) system.

A high-speed CMOS image capture module for its T2000 test platform that enables highly parallel, 64-site testing of both D-PHY and C-PHY devices for the rapidly growing smart phone market has been introduced by Advantest.

Advantest has introduced two new general-purpose hardware instruments – the 500MDM digital module and the DPS32A power supply module – to boost the capabilities of its T2000 test platform for a variety of applications such as system-on-a-chip (SoC) devices, power-management ICs, automotive devices and CMOS image sensors for the growing digital transformation market.

Advantest and STMicroelectronics have jointly developed an advanced, fully-automated final-test cell system that improves overall equipment efficiency and quality in semiconductor test and packaging operations.

The latest storage and memory test solutions will be displayed by Advantest at the virtual Flash Memory Summit, North America’s largest solid-state storage conference (November 10-12).

Semiconductor test equipment supplier Advantest has issued an international call for papers for its VOICE 2021 Developer Conference focusing on leading-edge technologies and future trends.

Semiconductor test equipment supplier Advantest has introduced its next-generation V93000 testers targeted at advanced digital ICs up to the exascale performance class.  

Semiconductor test supplier Advantest will participate in the first virtual SEMICON Southeast Asia (SEMICON SEA) on August 11-21 as a sponsor, exhibiting its latest end-to-end IC test solutions and presenting a technical paper.