Events News

Award-winning SPI system exhibited

8th April 2015
Jordan Mulcare
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Vi TECHNOLOGY will exhibit in Booth 7A-331 at SMT Hybrid Packaging, scheduled to take place 5th to 7th May, 2015 at the Messe in Nuremberg, Germany. PI, Vi TECHNOLOGY's award-winning SPI system that has been recognised by the industry as the 'most innovative' SPI product since the introduction of Moiré systems, will be on display.

PI's 360° Moiré technology, offers a unique review image and outstanding performance through unambiguous Z referencing and compensation. PI is the only inspection system to programme automatically, therefore inspection quality is not reliant on the training of the programmer.

Being the new SPI generation, Pi is fully connectable and provides solutions to improve processes. Combined with Sigma Link and AOI solutions, Pi enables the user to improve processes through a complete analysis of the solder joints versus solder paste deposit. Pi also is compatible with all major printers.

The 5K series, which offers flexibility for wider board applications and benefits from all the latest Vi TECHNOLOGY innovations, including Selective 3D AOI technology for accurate tilt and coplanarity measurement of ICs, connectors and passive components if 3D inspection of specific parameters is required, will be on display also. The series also provides enhanced color viewing on the DefectViewer station to facilitate operator repair jobs.

The innovative and modular concept of the 5K series allows companies requiring entry-level or mid-range AOI systems to upgrade their equipment on-site to meet future requirements. The series has been designed with best-in-class hardware and software technologies to provide accuracy, repeatability and a short cycle time.

Finally, Sigma Review is a new web-based multi-step multi-line review software that will be highlighted at the show. By displaying & correlating both SPI and AOI data and images, including reference images, Sigma Review opens the way to defect root cause analysis.

Predefined IPC defect categories offer a simple and robust classification environment. Based on the classified defects, Sigma Review can suggest corrective actions for the operator. Sigma Analysis is a new web-based real-time yield analysis software that offers powerful data mining solutions and drill down analysis.

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