Several hardware products for PCB testing and In-System [Device] Programming will premiered by JTAG Technologies at SMTA in Schaumburg, Illinois ( 19-20 Septeber). The company will also showcase its collaborative product with Altium – JTAG Maps plus various functional tester products.
JTAG’s extensive ‘Symphony’ range of 3rd party tester integration products will be on display. Use of the Symphony options allows the very latest professional JTAG/boundary-scan capabilities to be added to existing ATE from Teradyne, Keysight, SPEA, Seica, NI and others.
The JT 5705/FXT Multi-Function Testerwill also be on parade, It is an example of JTAG’s ‘fixture embedded’ test technology. The tester is built into one of the small linear series of cassette-based re-configurable fixtures of Everett Charles Technologies (ECT).
It is a compact, single-board test system that supports analog measurement and stimulus, frequency measurements, digital I/O, boundary-scan testing and also in-system device programming. Within the fixture multiple JT 5705/FXT tester cards can be mounted on purpose–built carriers featuring the ATE industry standard ‘Pylon’ connectors, making test system build a snap.
A modular concept of a newly designed base-level 19in. U rack-mount chassis assembly that can house up to four customer-specified modules offering various JTAG (IEEE 1149.x) controllers, digital IO and analogue IO and other measurement features.
The modules are either ½ rack or ¼ rack width and are available in different configurations.