Inspection & Test

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Ground fault option enhances pick-and-place handler

Ground fault option enhances pick-and-place handler
A ground fault monitoring option has been added to the Multitest MT2168 pick-and-place handler. The ground fault monitoring option is part of a feature set that will enhance the value of the production output at the customer site. Ground fault monitoring is an important feature for meeting advanced quality standards.
14th May 2018

Floating power source extends IC test capabilities

Floating power source extends IC test capabilities
Leading semiconductor test equipment supplier Advantest has extended the performance of its V93000 single scalable platform with the FVI16 floating power VI source for testing power and analogue ICs used in automotive, industrial and consumer mobile-charging applications such as the growing e-mobility and rapid charger market.
3rd May 2018

Software option protects FPGA designs

Software option protects FPGA designs
A Security Key Programming software option that allows programming of a 256-bit AES key for Altera Cyclone V FPGAs has been released by Goepel electronic. It activates the design security in the FPGA, thus bitstreams can no longer be analysed. This protects the FPGA design against re-engineering, cloning and copying.
11th April 2018


Memory tester supports DDR5 and LP-DDR5 devices

Memory tester supports DDR5 and LP-DDR5 devices
Semiconductor test equipment supplier Advantest has introduced its T5503HS2 memory tester, a test solution for the fastest memory devices available today as well as next-generation, super-high-speed DRAMs. The new system’s flexibility extends the capabilities of the T5503 product family in the current “super cycle,” of skyrocketing memory market growth.
4th April 2018

Kelvin contactor gets thumbs-up from IDM

Kelvin contactor gets thumbs-up from IDM
A major Integrated Device Manufacturer (IDM) has selected Multitest’s ecoAmp Kelvin Contactor as its strategic test interface product for existing and future high power test applications at high volume production. The decision follows an in-depth evaluation phase.
28th March 2018

Wireless test set gets thumbs-up for IoT chip tests

Wireless test set gets thumbs-up for IoT chip tests
Huawei has endorsed Anritsu’s MT8870A high-speed wireless test platform for its RF calibration and validation tests. The Test Set provides support for the Hi2110 and Hi2115 NB-IoT chipsets designed for IoT use cases. Anritsu’s MT88xx series long-established connectivity and cellular test methodologies provide Huawei with improve product quality and manufacturing efficiency.
20th March 2018

Silicon validation alternative ready for Dresden DATE

CloudTesting Services (CTS) will be showcased by Advantest at DATE 2018, the European event for electronic systems design and test in Dresden (March 19-23). The CTS test solution offers the latest high-quality test methods utilising on-demand IPs, characterisation tools, analysis and more.
19th March 2018

est module boosts accuracy, enhances output

est module boosts accuracy, enhances output
The next generation of its 6DOF gyro test module for singulated packages has been released by Multitest. It provides significant production benefits resulting in even lower cost of test, enhanced test accuracy and higher daily output. The module has been optimised for operational cost, uptime and stimulus clearness and accuracy.
14th March 2018

Observing ultrafast processes with attosecond resolution

Observing ultrafast processes with attosecond resolution
Many chemical processes run so fast that they are only roughly understood. To clarify these processes, a team from the Technical University of Munich (TUM) has now developed a methodology with a resolution of quintillionths of a second. The new technology stands to help better understand processes like photosynthesis and develop faster computer chips. An important intermediary step in many chemical processes is ionisation.
20th February 2018

Electronic load boasts voltage accuracy of 0.1%

The EA Elektro Automatik EL 3000 B Series for automated testing in workshops, laboratories, education, R&D and industry is in stock at Farnell element14. This series is an ideal bench-top tool for low-power component- and device testing, providing accurate and reproducible test data.
13th February 2018


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Imagineering Fair at Bath & West Show
30th May 2018
United Kingdom The Royal Bath & West Society Showground, Somerset
PCIM 2018
5th June 2018
Germany Nuremberg
Developing secure and scalable IoT solutions
21st June 2018
United Kingdom Cocoon Networks, London
SENSOR+TEST 2018
26th June 2018
Germany Nürnberg Exhibition Centre
European Microwave Week 2018
23rd September 2018
Spain Ifema Feria De Madrid