Inspection & Test

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Detector option enhances assemblies inspection kit

Detector option enhances assemblies inspection kit
The inline X-ray system X Line · 3D Series 400 from Goepel has a new detector option for high-resolution 3D X-ray inspection of electronic assemblies. The MultiAngle Detector 3 combines the high image quality of the StingRay Detector introduced last year with the rapid inspection speed of a scanning image.
15th May 2019

Software bridges route from DfT to ATE

Software bridges route from DfT to ATE
A software bridge, dubbed SmartShell has been introduced by Advantest to enable direct communication between any of its V93000 single scalable platform testers and electronic design automation (EDA) environments such as Tessent Silicon Insight software from Mentor.
13th May 2019

Invests in latest flying probe test system

Invests in latest flying probe test system
As part of a commitment to providing customers with the best technological systems and an unrivalled service, Electronics Manufacturing Solutions provider AWS Electronics Group has recently invested in the high specification SPEA 4050 flying probe test machine. 
8th May 2019


Module enables testing of hi-res audio devices

Module enables testing of hi-res audio devices
The GPWGD high-resolution module from Advantest features what is claimed to be the industry’s highest analogue-performance digitiser. It supports testing of high-resolution audio digital-to-analogue converters (DACs) embedded in power-management ICs (PMICs) as well as stand-alone high-resolution audio devices.
7th May 2019

Optical fibre vapour permeability measurement system

Optical fibre vapour permeability measurement system
Water vapour permeability is critical in optical fibres not only because the strength of polymer coated fibres depends on water vapour activity at the polymer/glass interface (because of stress corrosion) but also due to the spectral shift response of optical whispering-gallery modes due to the adsorption and desorption of water molecules.
22nd February 2019

US, EU support announced for wireless data logger

US, EU support announced for wireless data logger
Semiconductor test equipment supplier Advantest has expanded overseas support for its AirLogger WM2000 series of wireless data loggers. Following the expansion of support to China and Vietnam, as announced in January 2019, the company also started support in the United States, EU and Thailand from February.
18th February 2019

Instrument enables scalability for automotive device test

Instrument enables scalability for automotive device test
Automotive power electronics ICs are complex and have stringent test requirements. Typically this limits how many IC’s can be tested in parallel, and thus inhibits the cost-effectiveness of modern highly parallel manufacturing test strategies. The Diamondx platform, with a range of power and automotive instrumentation featuring SmartMux, breaks this barrier and enables maximum efficiency.
6th February 2019

Galvo scanner for laser micromachining

Galvo scanner for laser micromachining
Provider of high-performance motion control and positioning systems, Aerotech, has introduced the AGV-SPO, a new high-performance Galvo Scanner. It offers a larger field of view than conventional 2D scanners, reduces laser spot distortion, and is flexible enough to accommodate a wide range of laser wavelengths thanks to a large variety of mirror surfaces.
30th January 2019

Coaxial contactor cuts cross talk to lower signal jitter

Coaxial contactor cuts cross talk to lower signal jitter
The ICON contactor is designed specifically for maintaining the native impedance of the device–under–test (DUT) through the contactor to the test system. Functional and AC parametric testing of high speed devices requires a high and bandwidth low noise interconnect to maintain the quality and/or fidelity of the test signal.
28th January 2019

Contactor combines advanced test features at high temperatures

Contactor combines advanced test features at high temperatures
cDragon from Cohu combines advanced test features at temperatures from -55 °C to +155 °C with best RF capabilities and an innovative pin design for highest test yield and low cost of ownership. The closed-loop Intelligent Contactor Option controls the required conditions for the device under test (DUT).
8th January 2019


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Sensor+Test 2019
25th June 2019
Germany Nürnberg Messe
DSEI 2019
10th September 2019
United Kingdom EXCEL, London
European Microwave Week 2019
29th September 2019
France Porte De Versailles Paris
Engineering Design Show 2019
16th October 2019
United Kingdom Ricoh Arena, Coventry
ELIV 2019
16th October 2019
Germany Bonn World Conference Center