Inspection & Test

Displaying 1 - 10 of 327

Stimulus test cell accelerates sensor testing

Stimulus test cell accelerates sensor testing
The HA7300 stimulus test cell announced by Advantest is a full capability solution for the testing of differential pressure sensors which are becoming pervasive in modern automobile designs focused on better fuel economy and green technologies. The HA7300 delivers high-speed, highly precise test temperature control with a proprietary technology that utilises a heat or cold plate to control the temperature of the sensors under test.
8th December 2017

Probe heads offer wafer level chip test alternative

Probe heads offer wafer level chip test alternative
The Volta Series probe heads from Smiths Interconnect are optimised for wafer-level chip-scale package testing. As phones and smart devices get more powerful, so do the integrated chips that support them. Volta is used for testing the chips (while in their wafer form) that are behind everything from Bluetooth and power management to digital display controllers.
8th December 2017

Enhanced modules aid EV powertrain tests

Semiconductor test equipment supplier Advantest has introduced two modules that enable its T2000 IPS system to test high-voltage and high-power devices used in the power trains of electric vehicles (EV/HV). The enhanced MMXHE (multifunction mixed high voltage) and MFHPE (multifunction floating high power) modules enable massively parallel, high-performance testing by leveraging Advantest’s multifunctional pin design, which allows flexibility in assigning test resources to any pin.
4th December 2017


Automated handler cuts cost of mobile IC test

Automated handler cuts cost of mobile IC test
The M4171 handler from semiconductor test equipment supplier Advantest has been developed to meet the mobile electronics market’s needs for cost-efficient thermal control testing of ICs with high power dissipation during device characterisation and pre-production bring up.
28th November 2017

Water vapour permeability testing

Water vapour permeability testing
One reason for faults in electronic products is water vapour which can all too easily permeate into any enclosure, casing, fibre or component - once inside it condenses and causes problems. One solution is from Versaperm which can measure the vapour permeability of both complete products and components or material samples.
27th November 2017

Computing platform supports materials analysis

Computing platform supports materials analysis
Devices depend highly on novel materials with tailored function. A comprehensive spectroscopic analysis toolkit will shed light on the properties of a variety of materials across a broad energy range, streamlining the effort. Nanomaterials are increasingly important to new devices and, thanks to rapid advances in microscopy and spectroscopy, characterising electronic, magnetic and crystallographic structure on the nanoscale is now possible.
23rd November 2017

Handling solution features double conveyor system

The XILS Handler Series family from EIIT has a new addition, the XILS600. The XILS600 is the ideal handling solution when multiple stations working in parallel are needed, but in a physical serial layout. It was specially designed for ISP (Flashing) and FCT (Functional) applications and, due to a special Instrumentation Subrack with a secondary interface to the fixture, ideal for using critical instruments.
19th November 2017

Thermal-imaging system sharpens images

Thermal-imaging system sharpens images
The newly launched FLIR ONE Pro thermal-imaging system for mobile devices is in stock at RS Components. With increased sensor resolution of 160x120, innovative VividIR processing for greater image sharpness, and new features added to the user-interface app, this third generation of the FLIR ONE family delivers even better value for professional and DIY users.
16th November 2017

productronica: Bed-of-nails tester cuts test costs

A scalable bed-of-nails test platform was showcased by SPEA at productronica in Munich. It delivers the high throughput (one system is typically able to replace two to six competitor machines, claims the company) and superior test coverage of component failures, process defects, components key parameters, for the widest range of electronic products.
16th November 2017

Inspection workstation debuts at productronica

Inspection workstation debuts at productronica
An inspection workstation – the EVOTIS was premiered by Vision Engineering on the opening day of the productronica exhibition in Munich (November 14-17). The system for large area subjects such as PCBs and multi-layer components. It will cater for a wide range of tasks such as inspection, manipulation, reworking and training and can be easily used as a part of Quality Assurance (QA) standards.
14th November 2017


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