Inspection & Test

Displaying 1 - 10 of 362

Module extends tester's range to high-voltage semiconductors

Module extends tester's range to high-voltage semiconductors
A module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications has been introduced by Advantest. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdown voltages.
13th November 2018

Keysight and Cohu to work on 5G chips test solution

A collaboration between Keysight Technologies and Cohu, has been extended to deliver enhanced high volume manufacturing (HVM) solutions for the 5G semiconductor manufacturing test market. Integrating Keysight's 5G NR Signal Studio and PXI modular instruments with Cohu's HVM radio frequency (RF) test tools enables 5G semiconductor manufacturers to streamline the transition from device validation testing (DVT) to HVM.
7th November 2018

Parametric tester meets 28nm to 3nm process node needs

Leading semiconductor test equipment supplier Advantest has released its V93000 SMU8 parametric tester to meet chip makers’ process-characterisation and monitoring needs for the exacting measurements required on the 28nm to 3nm process nodes and beyond.
30th October 2018


JTAG to celebrate 25th anniversary at electronica

JTAG to celebrate 25th anniversary at electronica
The electronica exhibition in Munich (November 13-16) will see JTAG Technologies will celebrate 25 years of developing, supplying and supporting world-class board (PCBA) test and programming solutions based on IEEE Std 1149.x . During this period there have been a great many technological advancements within niche areas of board test and programming and in Aerospace, Automotive, Defence, Telecoms and Datacoms where many of the company’s customers operate.
26th October 2018

Software automates EMI testing

Software automates EMI testing
The R&S ELEKTRA EMC test software from Rohde & Schwarz fully automates electromagnetic interference (EMI) tests. It also covers electromagnetic susceptibility (EMS) to address both product development and certification in line with international standards.
24th October 2018

Parallel testing for NAND flash memories gets a boost

Parallel testing for NAND flash memories gets a boost
Two additional members of its next-generation B6700 family of burn-in memory testers have been announced by Advantest. The B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demandfor server and mobile data-storage applications.
24th October 2018

Market demand prompts next-generation memory tester

Market demand prompts next-generation memory tester
A next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle has been unveiled by Advantest. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.
10th October 2018

ISO approval upgrades semiconductor test facility

ISO approval upgrades semiconductor test facility
Semiconductors play increasingly important control roles in automotive, industrial and safety critical applications. Quality and reliability are therefore of vital importance and so Presto Engineering has completed certification to the ISO 9001:2015 quality standard at its facility in Caen, France, which is Europe's largest independent semiconductor test facility.
10th October 2018

Test platform can scale up to 5000 display driver digitisers

Test platform can scale up to 5000 display driver digitisers
The Diamondx test platform from Xcerra can scale up to over 5000 display driver digitisers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialised instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs.
30th September 2018

System finder simplifies test strategies

System finder simplifies test strategies
A test system finder unveiled by Digitaltest shows electronics manufacturers the right test system for their production in no time at all. The online tool can be accessed via the Digitaltest website and provides a meaningful recommendation for the implementation of the individual test strategy.
25th September 2018


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SPS IPC Drives 2018
27th November 2018
Germany Nuremberg
International Security Expo 2018
28th November 2018
United Kingdom London Olympia
The Security Event 2019
9th April 2019
United Kingdom NEC, Birmingham
Ceramics Expo 2019
29th April 2019
United States of America International Exposition Center (I-X Center)