Inspection & Test

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Optical fibre vapour permeability measurement system

Optical fibre vapour permeability measurement system
Water vapour permeability is critical in optical fibres not only because the strength of polymer coated fibres depends on water vapour activity at the polymer/glass interface (because of stress corrosion) but also due to the spectral shift response of optical whispering-gallery modes due to the adsorption and desorption of water molecules.
22nd February 2019

US, EU support announced for wireless data logger

US, EU support announced for wireless data logger
Semiconductor test equipment supplier Advantest has expanded overseas support for its AirLogger WM2000 series of wireless data loggers. Following the expansion of support to China and Vietnam, as announced in January 2019, the company also started support in the United States, EU and Thailand from February.
18th February 2019

Instrument enables scalability for automotive device test

Instrument enables scalability for automotive device test
Automotive power electronics ICs are complex and have stringent test requirements. Typically this limits how many IC’s can be tested in parallel, and thus inhibits the cost-effectiveness of modern highly parallel manufacturing test strategies. The Diamondx platform, with a range of power and automotive instrumentation featuring SmartMux, breaks this barrier and enables maximum efficiency.
6th February 2019


Galvo scanner for laser micromachining

Galvo scanner for laser micromachining
Provider of high-performance motion control and positioning systems, Aerotech, has introduced the AGV-SPO, a new high-performance Galvo Scanner. It offers a larger field of view than conventional 2D scanners, reduces laser spot distortion, and is flexible enough to accommodate a wide range of laser wavelengths thanks to a large variety of mirror surfaces.
30th January 2019

Coaxial contactor cuts cross talk to lower signal jitter

Coaxial contactor cuts cross talk to lower signal jitter
The ICON contactor is designed specifically for maintaining the native impedance of the device–under–test (DUT) through the contactor to the test system. Functional and AC parametric testing of high speed devices requires a high and bandwidth low noise interconnect to maintain the quality and/or fidelity of the test signal.
28th January 2019

Contactor combines advanced test features at high temperatures

Contactor combines advanced test features at high temperatures
cDragon from Cohu combines advanced test features at temperatures from -55 °C to +155 °C with best RF capabilities and an innovative pin design for highest test yield and low cost of ownership. The closed-loop Intelligent Contactor Option controls the required conditions for the device under test (DUT).
8th January 2019

Innovation pressure vs in-circuit test

Innovation pressure vs in-circuit test
If a product is improved or obsolete components have to be replaced, these changes will affect every process in electronics manufacturing. From solder paste printing to assembly, inspection, and testing, none of these steps will remain unchanged for long. In-circuit testing (ICT) is often a major challenge for redesigns.
11th December 2018

Platform opens two routes to DDR4 testing

Platform opens two routes to DDR4 testing
Engineers designing with Double Data Rate 4 (DDR4) memory devices can quickly deploy tests for shorts and opens on control, address and data lines with the boundary scan test (BST) tools of ASSET InterTech’s ScanWorks platform for fast test and programming.
5th December 2018

Experiment confirms high-speed potential of STT-MRAM

Experiment confirms high-speed potential of STT-MRAM
A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems led by Tetsuo Endoh has successfully demonstrated operation of a high-writing-speed spin-transfer torque magnetic random access memory (STT-MRAM) using an Advantest memory test system.
5th December 2018

Photomask measurement tool increases throughput

Photomask measurement tool increases throughput
A tool that measures fine pattern dimensions on photomasks with higher precision and stability has been launched by Advantest. The E 3650 MASK MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) uses the company’s proprietary technology.
29th November 2018


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Hannover Fair 2019
1st April 2019
Germany Hannover
The Security Event 2019
9th April 2019
United Kingdom NEC, Birmingham
Ceramics Expo 2019
29th April 2019
United States of America International Exposition Center (I-X Center)
Electronics & Applications 2019
14th May 2019
Netherlands Jaarbeurs Utrecht Hall 7 Jaarbeursplein
Agile for Automotive 2019
15th May 2019
United States of America Detroit, MI