Inspection & Test

Displaying 1 - 10 of 351

Test solutions extended to support Intel Arria 10 SoC

Test solutions extended to support Intel Arria 10 SoC
The embedded board test technologies ChipVORX and VarioTAP from GOEPEL electronic now support the Intel Arria 10 SoC (System-on-Chip). The new IP models simplify testing and programming of the devices.
9th September 2018

Shielding and filtering are not independent of one another

Shielding and filtering are not independent of one another
In this article, Keith Armstrong, FIEE/IET, Senior MIEEE, ACGI, EurIng(Gp1), on behalf of EMC Standards, outlines some of the issues he has encountered after having been asked to fix EMC problems, and how designers can learn to ensure that filtering and shielding are compatible.
14th August 2018

12.8Gbps instrument tests leading-edge SerDes ports

12.8Gbps instrument tests leading-edge SerDes ports
The Xcerra HSI1x instrument from Xcerra for the well-established Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such as MIPI, PCIexpress, VbyOne, HDMI and USB, found on the latest applications processors, flat panel display devices, and other high performance ICs.
9th August 2018


Test and programming tools hasten SOC systems design

Test and programming tools hasten SOC systems design
Faster test and programming tools from ASSET InterTech will accelerate development and production cycles for designs based on Xilinx Zynq-7000 SoCs. These new tools, which join the ScanWorks platform for fast test and programming, take advantage of a target agent running out of a small amount of on-chip memory associated with one of the Arm Cortex cores in the Zynq-7000 SoC.
9th August 2018

Holistic test solution streamlines SSD transition

A fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) has been launched by Advantest on the MPT3000 platform. This is the same tester used by manufacturers of PCIe Gen 3, SATA and SAS SSDs. The all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market.
2nd August 2018

Semiconductor test handler meets growing demand

Semiconductor test handler meets growing demand
A major player in global semiconductor manufacturing has installed XCerra’s MT2168 XT Semiconductor Test Handler. The handler meets the growing demand in high volume production for reliable and cost-efficient tri-temp test handling of multi-chip packages and modules in the automotive and consumer markets.
24th July 2018

Quantifying SF6 and PCBs with Nexis GC-2030

Quantifying SF6 and PCBs with Nexis GC-2030
Shimadzu’s technology and expertise in gas sampling has enabled it to develop a bespoke Nexis GC-2030 for Celtic Recycling in Newport, Gwent, allowing the company to introduce GC screening of reclaimed and recycled SF6 gas, a service that no other company in the UK is currently able to offer. At the same time, the new system increased the laboratory’s capacity for the analysis of polychlorinated biphenyls (PCBs) in insulating oils.
20th July 2018

Flying probe test system handles oversized pcbs

Flying probe test system handles oversized pcbs
The range of Flying Probe test systems at atg Luther & Maelzer has been extended with a line for test areas of up to 40in. width. The oversized systems complement the standard line which can load boards with sizes of up to 27in. width. Special network technology and aerospace applications are driving the demand for high test coverage and 4-wire testing (Kelvin test) for large PCBs.
13th July 2018

Thermal camera sharpens focus for hotspot inspection

Thermal camera sharpens focus for hotspot inspection
The T500 Series thermal camera with new Macro mode facility from FLIR Systems provides a solution for electronics inspection applications such as finding hot spots on printed circuit board assemblies (PCBAs) and ensuring that various components are working within their design limits.
5th July 2018

Laser scanning halves inspection times

Laser scanning halves inspection times
Czech company Lukov Plast, a producer of injection moulded plastic parts, electronic components and electrical sub-assemblies for the automotive industry, has reported faster inspection cycles and feature measurements following the purchase of a Nikon Metrology LC15Dx laser scanner.
20th June 2018


Inspection & Test documents


Sign up to view our publications

Sign up

Sign up to view our downloads

Sign up

Connected World Summit 2018
25th September 2018
United Kingdom Printworks, London
IoT Solutions World Congress 2018
16th October 2018
Spain Barcelona
Engineering Design Show 2018
17th October 2018
United Kingdom Ricoh Arena, Coventry
Maintec 2018
6th November 2018
United Kingdom NEC, Birmingham
electronica 2018
13th November 2018
Germany Messe Munchen