Inspection & Test

Displaying 11 - 20 of 368

Software automates EMI testing

Software automates EMI testing
The R&S ELEKTRA EMC test software from Rohde & Schwarz fully automates electromagnetic interference (EMI) tests. It also covers electromagnetic susceptibility (EMS) to address both product development and certification in line with international standards.
24th October 2018

Parallel testing for NAND flash memories gets a boost

Parallel testing for NAND flash memories gets a boost
Two additional members of its next-generation B6700 family of burn-in memory testers have been announced by Advantest. The B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demandfor server and mobile data-storage applications.
24th October 2018

Market demand prompts next-generation memory tester

Market demand prompts next-generation memory tester
A next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle has been unveiled by Advantest. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.
10th October 2018


ISO approval upgrades semiconductor test facility

ISO approval upgrades semiconductor test facility
Semiconductors play increasingly important control roles in automotive, industrial and safety critical applications. Quality and reliability are therefore of vital importance and so Presto Engineering has completed certification to the ISO 9001:2015 quality standard at its facility in Caen, France, which is Europe's largest independent semiconductor test facility.
10th October 2018

Test platform can scale up to 5000 display driver digitisers

Test platform can scale up to 5000 display driver digitisers
The Diamondx test platform from Xcerra can scale up to over 5000 display driver digitisers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialised instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs.
30th September 2018

System finder simplifies test strategies

System finder simplifies test strategies
A test system finder unveiled by Digitaltest shows electronics manufacturers the right test system for their production in no time at all. The online tool can be accessed via the Digitaltest website and provides a meaningful recommendation for the implementation of the individual test strategy.
25th September 2018

E-beam lithography system features at MNE show

Leading semiconductor test equipment supplier Advantest will feature its F7000 EB (electron beam) lithography system and other nanotechnology-ready equipment at the Micro and Nanoengineering (MNE) show in Copenhagen (September 25-27). The MNE program and exhibition covers current and relevant activities in micro- and nanoengineering.
24th September 2018

Test solutions extended to support Intel Arria 10 SoC

Test solutions extended to support Intel Arria 10 SoC
The embedded board test technologies ChipVORX and VarioTAP from GOEPEL electronic now support the Intel Arria 10 SoC (System-on-Chip). The new IP models simplify testing and programming of the devices.
9th September 2018

Shielding and filtering are not independent of one another

Shielding and filtering are not independent of one another
In this article, Keith Armstrong, FIEE/IET, Senior MIEEE, ACGI, EurIng(Gp1), on behalf of EMC Standards, outlines some of the issues he has encountered after having been asked to fix EMC problems, and how designers can learn to ensure that filtering and shielding are compatible.
14th August 2018

12.8Gbps instrument tests leading-edge SerDes ports

12.8Gbps instrument tests leading-edge SerDes ports
The Xcerra HSI1x instrument from Xcerra for the well-established Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such as MIPI, PCIexpress, VbyOne, HDMI and USB, found on the latest applications processors, flat panel display devices, and other high performance ICs.
9th August 2018


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LOPEC 2019
19th March 2019
Germany Messe Munchen