Test & Measurement

Simultaneously evaluate a component from five sides

3rd July 2015
Jordan Mulcare
0

In addition to the software solution ChipControl, which contains a specialised command set for the inspection of various semiconductor parts, EVT now has developed the ready-to-use system ChipEye 5Side, which can be built into the machine to solve a large variety of applications with the already well proven commands. Users can inspect Pin 1, coplanarity, scratches and many more.

With the five sided slot in ChipEye, a component part can be captured with the camera and evaluated by the software from five different sides at the same time. The robust body of the slot and the powerful camera with resolutions from 640x480 to 1448x2050px allow it to detect even the smallest defects and measure the pin gap, for example, accurate to a micrometre.

Depending on the application, the function range of the software can be adapted to the task, so that a special vision sensor for coplanarity is created. This vision sensor can be purchased as a complete system under the name ChipEye Coplanarity.

This system contains the illumination, lens, camera and software. The parametrisation of the system is based on an easy drag-and-drop solution, as it is already known from the EVT EyeVision software. The engine driver has the possibility to use an integrated WebServer to control the inspection and vernier adjustments. The WebServer allows users to control and modify the parameters from any browser.

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