Software for scanning electron microscope users

6th April 2017
Posted By : Peter Smith
 Software for scanning electron microscope users

Hitachi’s new map 3D software based on Mountains Technology is said to open up a world of opportunities for researchers and industrial engineers using Hitachi High-Technologie’s scanning electron microscopy (SEM) systems.

Thanks to the partnership between Hitachi High-Technologies and Digital Surf, users now have full access to a set of powerful tools for visualizing, analysing and reporting on their data. This includes:

  • Ultrafast 3D reconstruction of surface topography
  • Image colourization and enhancement
  • Topography measurements including the volume of surface structures (bumps, holes), step heights, contour etc.
  • Characterization of surface roughness and texture – advanced roughness/waviness filtering techniques – 2D and 3D parameters from Ra to ISO 25178.

Available in 11 different languages, Hitachi map 3D also offers easy-to-use automation tools to speed up analysis. The interactive workflow allows full traceability and easy fine-tuning at any time in the analysis process. Analysis reports can be exported in standard formats for publication (Excel, PDF and Word-compatible RTF). All images can be output at up to 1200 dpi for integration into posters and presentations.


You must be logged in to comment

Write a comment

No comments




More from Digital Surf SARL

Sign up to view our publications

Sign up

Sign up to view our downloads

Sign up

IoT Tech Expo 2019
25th April 2019
United Kingdom Olympia, London
Ceramics Expo 2019
29th April 2019
United States of America International Exposition Center (I-X Center)
PCIM 2019
7th May 2019
Germany Nürnberg Messe
Electronics & Applications 2019
14th May 2019
Netherlands Jaarbeurs Utrecht Hall 7 Jaarbeursplein
Agile for Automotive 2019
15th May 2019
United States of America Detroit, MI