Tester accommodates a wide range of SSD form factors

24th July 2019
Posted By : Mick Elliott

Developed to test and debug solid-state drives (SSD), the MPT3000ARC system is the newest member of Advantest’s MPT3000 product family. The fully integrated MPT3000ARC can operate over a broad temperature range to test all SSDs used in rapidly multiplying applications, including connected devices from smart cars to wearable electronics.

Increasing volumes of SSDs are being used in rugged thermal environments. These devices must be proven to withstand harsh conditions. This system enables extended thermal testing by meeting automotive and industrial thermal test standards while applying the same proven architecture, software and performance – including PCIe Gen 4 support – already in wide use by SSD manufacturers.

It has the versatility to accommodate a wide range of SSD form factors, from 40mm M.2 memories to larger EDSFF devices, through changeable and customisable interface boards.

Changing interface boards is quick and easy, enabling rapid changeover to support a wide variety of SSD products on a single system.

The system features the same tester-per-DUT architecture and hardware acceleration as all MPT3000 products for enhanced efficiency and performance.

Adding the extended range thermal chamber creates a solution that targets reliability demonstration test (RDT) and, with production-compatible ergonomics and automation-friendly chamber access, also addresses volume-production SSD testing.

Leveraging the same site modules and power supplies in each tester, the MPT3000 series now includes the new MPT3000ARC, the MPT3000ES2 engineering system, the MPT3000EV2 for RDT and the MPT3000HVM2 for high-volume production testing.

These systems cover SSD testing from design to manufacturing, providing SSD suppliers with the fastest, lowest risk path to market for their next-generation storage devices, including PCIe Gen 4 devices.

The MPT3000ARC system is available to customers now.

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